Simulation of near-field scanning optical microscopy using a plasmonic gap probe
نویسندگان
چکیده
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملScanning near-field optical microscopy.
An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today's science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and...
متن کاملMapping near-field plasmonic interactions of silver particles with scanning near-field optical microscopy measurements
A scanning near-field optical microscope (SNOM) is a powerful tool to investigate optical effects that are smaller than Abbe’s limit. Its greatest strength is the simultaneous measurement of high-resolution topography and optical near-field data that can be correlated to each other. However, the resolution of an aperture SNOM is always limited by the probe. It is a technical challenge to fabric...
متن کاملNear-field scanning optical microscopy using polymethylmethacrylate optical fiber probes.
We report the first use of polymethylmethacrylate (PMMA) optical fiber-made probes for scanning near-field optical microscopy (SNOM). The sharp tips were prepared by chemical etching of the fibers in ethyl acetate, and the probes were prepared by proper gluing of sharpened fibers onto the tuning fork in the conditions of the double resonance (working frequency of a tuning fork coincides with th...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2006
ISSN: 1094-4087
DOI: 10.1364/oe.14.010603